Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1980-02-11
1982-03-02
Tokar, Michael J.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324158P, 324457, G01R 3102
Patent
active
043180426
ABSTRACT:
A detecting electrode (22) is formed on a substrate (28), an amount of potential from a charged surface (23) induced in the detecting electrode (22) corresponding to a potential on the surface (23). A guard electrode (26) formed on the same surface of the substrate (28) as the detecting electrode (22) surrounds the detecting electrode (22). Part of the guard electrode (26b) is formed on the back surface of the substrate (28). The detecting electrode (22) is connected to a non-inverting input of an operational amplifier (24). The output of the operational amplifier (24) is connected to the inverting input thereof and also to the guard electrode (26) to produce unity gain and place the guard electrode (26) at the same potential as the detecting electrode (22). The substrate (28) is formed of a material such that the electrical resistance between the detecting electrode (22) and the guard electrode (26) is at least 10.sup.9 ohms to reduce zero drift to a negligible value.
REFERENCES:
patent: 4065717 (1977-12-01), Kattner
patent: 4161692 (1979-07-01), Tarzwell
patent: 4233562 (1980-11-01), Blythe
K. Greene, "Flexible Electrical Probe and Method of Manufacture", IBM Tech. Disc. Bull., vol. 19, No. 12, May 1977, pp. 4686, 4687.
S. Frese, "Electrostatic Flex Probe", IBM Tech. Disc. Bull., vol. 6, No. 5, Oct. 1963, p. 39.
Eda Tadahiro
Imai Chikara
Tatsumi Susumu
Alexander David G.
Ricoh & Company, Ltd.
Tokar Michael J.
LandOfFree
Electrometer probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrometer probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrometer probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-61233