Electromagnetic wave measuring apparatus

Details Electromagnetic wave measuring apparatus Electromagnetic wave measuring apparatus

2009-11-12

2011-11-08

Porta, David (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

Reexamination Certificate

active

08053733

ABSTRACT:
A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] incident to a device under a test while decreasing a beam diameter of the electromagnetic wave to be measured, a scanning stage which rotates, about a line orthogonal to an optical axis of the incident lens as a rotational axis, the device under the test or the optical axis, and an electromagnetic wave detector which detects the electromagnetic wave to be measured which has transmitted through the device under the test, where a coordinate on the optical axis of a position which gives the minimum value d of the beam diameter is different from a coordinate on the optical axis of the rotational axis.

REFERENCES:
patent: 5428447 (1995-06-01), Toida
patent: 6208886 (2001-03-01), Alfano et al.
patent: 6828558 (2004-12-01), Arnone et al.
patent: 2001/0029436 (2001-10-01), Fukasawa
patent: 2005/0023470 (2005-02-01), Ferguson et al.
patent: 2006/0267848 (2006-11-01), Nagashima
patent: 2008/0013071 (2008-01-01), Tsumura et al.
patent: 2008/0217536 (2008-09-01), Sekiguchi et al.
patent: 2010/0006758 (2010-01-01), Sekiguchi et al.
patent: 2010/0288928 (2010-11-01), Katagiri et al.
patent: 6-50727 (1994-02-01), None
patent: 2002-98634 (2002-04-01), None
patent: 2006-133178 (2006-05-01), None
patent: 2006-275867 (2006-10-01), None
patent: 2008-249695 (2008-10-01), None
patent: 2009-192524 (2009-08-01), None
Search report from P.C.T., mail date is Dec. 28, 2010.

Affiliated with

Also associated with

Rating

Electromagnetic wave measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electromagnetic wave measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electromagnetic wave measuring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4289375