Electromagnetic profile scanner

Details Electromagnetic profile scanner Electromagnetic profile scanner

1994-11-29

1997-03-25

Buczinski, Stephen C.

Optics: measuring and testing

Range or remote distance finding

Triangulation ranging to a point with one projected beam

356376, 382106, 25055923, G01B 1124, G01C 700

Patent

active

056150032

ABSTRACT:
A system for determining the shape and dimensions of a surface of an object includes a projector for projecting onto the object a spatially coded pattern of radiation, e.g., light. The system also includes a receiving device capable of imaging the reflected pattern, and a discriminator for determining which portion of the reflected pattern corresponds to which portion of the projected pattern. By this means, a received signal representing less than the complete reflection from the projected pattern can be correlated with a discrete portion of the scanned object. The procedure is repeated to obtain enough reliable data to generate a reasonably reliable surface profile. The resulting set of received signals and correlations are used to calculate the shape and dimensions of the object.

REFERENCES:
patent: Re32984 (1989-06-01), Rosenfeld et al.
patent: 3543241 (1970-11-01), Leuck
patent: 3617707 (1971-11-01), Shields et al.
patent: 3699312 (1972-10-01), Jones et al.
patent: 3761685 (1973-09-01), Alpert et al.
patent: 3866052 (1975-02-01), Di Matteo et al.
patent: 4188544 (1980-02-01), Chasson
patent: 4197888 (1980-04-01), McGee et al.
patent: 4613234 (1986-09-01), Cruickshank
patent: 4634278 (1987-01-01), Ross et al.
patent: 4645348 (1987-02-01), Dewar et al.
patent: 4648717 (1987-03-01), Ross et al.
patent: 4667099 (1987-05-01), Arai et al.
patent: 4687325 (1987-08-01), Corby, Jr.
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4846577 (1989-07-01), Grindon
patent: 4900146 (1990-02-01), Penney et al.
patent: 4937445 (1990-06-01), Leong et al.
patent: 4941100 (1990-07-01), McFarlane et al.
patent: 5041726 (1991-08-01), Chang et al.
patent: 5201351 (1993-04-01), Hurdle, Jr.
patent: 5307151 (1994-04-01), Hof et al.
patent: 5326961 (1994-07-01), Sibata et al.

Affiliated with

Also associated with

Rating

Electromagnetic profile scanner does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electromagnetic profile scanner, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electromagnetic profile scanner will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2208188