Electromagnetic microscope for evaluation of electrically conduc

Details Electromagnetic microscope for evaluation of electrically conduc Electromagnetic microscope for evaluation of electrically conduc

1992-02-20

1994-03-08

Wieder, Kenneth A.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324241, 324248, 324262, 505842, G01N 2787, G01R 33035

Patent

active

052931196

ABSTRACT:
An instrument for non destructive evaluation (NDE) is called an electromagnetic microscope, formed by superconductive microprobes arrayed in parallel rows. When moved over a test piece, the array generates a scanned image of flaws, stress variations or changes in composition. Each microprobe has a drive coil a few mm in radius that encircles pickup loops forming a concentric, coplanar gradiometer 1 mm or less in diameter, coupled to a superconducting quantum interference device (SQUID). Drive coils transmit an oscillating magnetic field that induces eddy or magnetization currents in conductive or ferromagnetic materials, respectively. The gradiometer senses distortions in paths of induced currents. The sensitivity of SQUIDs increases sensitivity, penetration depth, and spatial resolution of flaws.

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