Electromagnetic inductive probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration

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324 74, 324445, 324127, G01N 2707

Patent

active

057932140

ABSTRACT:
A highly accurate electromagnetic-induction-type conductivity and dielectric constant meter is obtained by using a calibration box (instrument) and a structure as below. The conductivity and dielectric constant meter employs an electromagnetic inductive probe which includes a primary transformer composed of a toroidal core with a wound primary coil, a secondary transformer composed of a toroidal core with a wound secondary coil, an electrostatic shield shielding the transformers, and cables that connect the probe to a meter. To eliminate the electrostatic capacity produced by causes other than electromagnetic induction, the structure of the probe is symmetrical. In a first embodiment, the secondary transformer is placed between two parts of the primary transformer, which has two cores of the same shape that are placed symmetrically. The structure, including the primary and secondary transformers, gaps in the electrostatic shields, and cables, are symmetrical with respect to a plane perpendicular to the central axis of the ring shapes and passes through the center of the annular core of the secondary transformer.

REFERENCES:
patent: 4425545 (1984-01-01), Scalese
patent: 5293128 (1994-03-01), Zhou
patent: 5341102 (1994-08-01), Akiyama
patent: 5397980 (1995-03-01), Blose
patent: 5453697 (1995-09-01), Schweer
patent: 5666058 (1997-09-01), Wakamatsu

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