Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1991-05-14
1994-05-24
Strecker, Gerard R.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324250, 324260, 250397, G01R 2908, G01R 3302, H01J 2500
Patent
active
053152336
ABSTRACT:
In order to take into account the effect of load resistance applied to an electromagnetic field in analyzing an electromagnetic wave oscillator, the present invention arranges a resistance equivalent to the load resistance in the analytical region, and converts a voltage applied to the load and the current flowing therein into an electric field component and a magnetic field component to analyze the electromagnetic field distribution of the entire analytical region. The motion of an electrical charge is thus analyzed taking into account a force applied to the electric charge by the electromagnetic field distribution. This compound analysis of both the electric charge motion and the electromagnetic field is alternately and repeatedly performed.
Ahagon Akira
Kita Hiromi
Kotera Hidetoshi
Sakiyama Kazuyuki
Do Diep
Matsushita Electric - Industrial Co., Ltd.
Strecker Gerard R.
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