Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-12-01
2010-12-14
Bui, Bryan (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C342S463000
Reexamination Certificate
active
07853437
ABSTRACT:
A system and method for detecting and identifying electronic devices based on their unintended electromagnetic emissions (“UEE”) signals is presented. During device classification, UEE signals are measured from a plurality of test devices and characteristic data is obtained from the UEE signal emitted from each test device. Using the characteristic data, a threshold value and ideal pulse template can be determined for each test device and stored in a memory. An ideal stimulation signal is also determined for each test device and stored in the memory. During device detection, the ideal stimulation signal is applied to the environment in which a target device is suspected of being located. Stimulated UEE signals are measured from the target device and processed. The processed measurement data is compared to stored power threshold values and ideal pulse templates to determine if the target device is present.
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Beetner Daryl G.
Hubing Todd H.
Seguin Sarah A.
Bui Bryan
Polsinelli Shughart PC
The Curators of the University of Missouri
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