Electromagnetic emissions and susceptibility calculating...

Details Electromagnetic emissions and susceptibility calculating... Electromagnetic emissions and susceptibility calculating...

2007-05-22

2007-05-22

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S064000, C702S058000, C703S013000

Reexamination Certificate

active

10920489

ABSTRACT:
A method and apparatus that predicts electromagnetic emissions and susceptibility attributes of an electric device. A simulation is conducted which utilizes a series of mathematical calculations to predict performance of four facets of electromagnetic interference (EMI): conducted emissions; conducted susceptibility; radiated emissions; and radiated susceptibility. The method and apparatus provides for the analytical evaluation of electromagnetic interference of electrical devices prior to testing and actual measuring of fields emitted by circuits, thereby providing a system for EMI control methods, EMI test costs, and device redesign and retest.

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