Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1996-12-05
1999-01-19
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324641, G01R 3102
Patent
active
058617531
ABSTRACT:
An electromagnetic compatibility (EMC) test cell has an electromagnetically screening enclosure which is rectangular in cross-section with a length and first and second pairs of opposed side walls. A first antenna array comprises a first array of conductors extending lengthwise in the enclosure distributed at positions between the first pair of side walls to produce, when energized in TEM-mode, an electric field in a first test region of the enclosure which is predominantly polarized in a direction parallel to the first pair of side walls. Second and third antenna arrays comprising respective second and third arrays of conductors extend lengthwise in the enclosure on opposite sides of the first test region. The conductors of each of the second and third arrays are distributed at positions between the second pair of side walls to produce, when energized in balanced TEM-mode, an electric field in a second test region between the second and third arrays which is predominantly polarized in a direction parallel to the second pair of side walls. Feeds connect to a feed end of the conductors of each array to energize the arrays, and impedance matched termination of the conductors of the arrays is provided. The resulting test cell can be energized either vertically or horizontally and provides a relatively large area of relatively uniform field.
REFERENCES:
patent: 5497099 (1996-03-01), Walton
M.L. Crawford, "Generation of Standard EM Fields Using TEM Transmission Cells", IEEE Transactions on Electromagnetic Compatibility, vol. 16, pp. 189-195, Nov., 1974.
D. Konigstein and D. Hansen, "A New Family of Tem-Cells with Enlarged Bandwidth and Optimized Working Volume", Proceedings of the Seventh International Symposium on EMC, pp. 127-132, Zurich 1987.
L. Carbonini, "Comparison of Analysis of a WTEM Cell With Standard TEM Cells for Generating EM Fields", IEEE Transactions of Electromagnetic Compatibility, vol. 35, No. 2, pp. 255-263, May, 1993.
F.B.J. Leferink, "A Triple-Tem Cell: Three Polarisations in One Setup", Proceedings of the Tenth International Symposium on EMC, pp. 573-578, Zurich 1993.
F.B.J. Leferink, "Triple-Tem Cell: A Simple Device for Immunity Testing", Proceedings of the IEEE International Symposium on EMC, pp. 455-459, 1994.
C. Wan, "Conformal Mapping Analysis of a Modified TEM Cell", IEEE Transactions on Electromagnetic Compatibility, vol. 35, No. 1, pp. 109-113, Feb., 1993.
L. Carbonini, "A Shielded Multi-Wire Transmission Line For Susceptibility Measurements with Horizontally Electric Field", Eighth IEEE International Conference on EMC, pp. 33-38, Edinburgh, Sep., 1992.
Koehler S.
Regan Maura K.
Thermo Voltek Europe B.V.
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