Electric lamp and discharge devices – Cathode ray tube – Plural beam generating or control
Reexamination Certificate
2000-02-25
2002-09-17
Patel, Vip (Department: 2879)
Electric lamp and discharge devices
Cathode ray tube
Plural beam generating or control
C313S409000, C313S460000
Reexamination Certificate
active
06452319
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an electron gun for a color cathode ray tube, and more particularly, to an electrode unit of an electron gun for a color cathode ray tube, for forming a large-diameter electronic lens.
2. Description of the Related Art
In a general electron gun for a color cathode ray tube, spherical aberration and focusing characteristics are greatly affected by a main lens. Thus, in order to obtain good focusing characteristics, the spherical diameter of the main lens must be increased.
However, in an in-line electron gun, since three electron beam passing holes are formed at at least two electrodes constituting an electronic lens in an in-line configuration and since the diameter of a neck portion of a funnel where the electron gun is mounted is limited, it is impossible to make the diameter of an electron beam passing hole larger than the distance between centers of two adjacent electron beam passing holes (to be referred to as “an eccentric distance” hereinafter).
An electrode unit for improving spherical aberration of the conventional main lens is disclosed in U.S. Pat. No. 4,370,592, which is shown in FIG. 1.
As shown in the drawing, burring portions
5
b
and
6
b
are formed at edges of a light emitting surface
5
a
of a focusing electrode
5
and a light receiving surface
6
a
of a final accelerating electrode
6
, and large-diameter electron beam passing holes
5
H and
6
H having a predetermined depth are formed in the center thereof. Also, R, G and B small-diameter electron beam passing holes
5
H′ and
6
H′ through which R, G and B electron beams pass independently are formed in the large-diameter electron beam passing holes
5
H and
6
H.
When electron beams pass through the main lens constructed of the focusing electrode
5
and the final accelerating electrode
6
, since the large-diameter electron beam passing holes
5
H and
6
H are non-circular, vertical and horizontal focusing components of the electron beams having passed through the small-diameter electron beam passing holes
5
H′ and
6
H′ in the center and the large-diameter electron beam passing holes
5
H and
6
H on both sides are different from each other. Thus, it is not possible to form uniform electron beam spots landing on the fluorescent surface. In other words, as shown in
FIG. 2
, the side electron beams RB and BB having passed through the large-diameter electron beam passing holes
5
H and
6
H of the focusing electrode
5
or the final accelerating electrode
6
are close to the burring portions
5
b
and
6
b
where a low voltage or a high voltage is horizontally distributed, and the central electron beam GB is relatively far from the burring portions
5
b
and
6
b
. Therefore, the side electron beams RB and BB are relatively strongly focused and the central electron beam GB is relatively weakly focused.
Also, since the distances between the side electron beams RB and BB and the burring portions
5
b
and
6
b
are different depending on the direction, the horizontal and vertical focusing forces for the side electron beams RB and BB are different from each other. Also, since the vertical distance between the central electron beam GB and the burring portions
5
b
and
6
b
is shorter than the horizontal distance therebetween, the central electron beam GB is applied to a focusing force which is strong in a vertical direction. Also, the central electron beam GB is applied to a divergent force in a diagonal direction of the large-diameter electron beam passing holes
5
H and
6
H. Thus, the side electron beams RB and BB having passed through the main lens have substantially triangular cross-sections and the central electron beam GB has a radially protruding cross-section, so that uniform electron beam cross-sections cannot be obtained throughout the entire surface of the fluorescent layer.
In particular, since the sizes of the small-diameter electron beam passing holes
5
H′ and
6
H′ are restricted by the diameter of a neck portion, there is a limit in increasing the eccentric distance between the small-diameter electron beam passing holes
5
H′ and
6
H′. Further, in order to reduce deflection current, the tendency is toward reduction in the diameter of a neck portion. Thus, the distance between the small-diameter electron beam passing holes
5
H′ and
6
H′ is reduced, which lowers spherical aberration and focusing characteristics.
An electrode unit of an electron gun for solving the above-described problem is disclosed in U.S. Pat. No. 5,414,323. As shown in
FIG. 3
, an electrode plate member
16
is disposed in the center of an outer electrode
11
having large-diameter electron beam passing holes, and a vertically elongated small-diameter electron beam passing hole
13
is formed in the center of the electrode plate member
16
. Both side edge portions are recessed in a semi-elliptic shape so as to form side electron beam passing holes
14
and
15
. According to this electrode unit, astigmatic aberration generated by the large-diameter electron beam passing hole can be eliminated by making the small-diameter electron beam vertically elongated. However, this electrode cannot easily compensate for 8-pole coma aberration of the central electron beam passing hole and for 6-pole coma aberration of side electron beam passing holes.
Another conventional large-diameter electrode unit is disclosed in U.S. Pat. No. 4,626,738. As shown in
FIG. 4
, this electrode includes an outer electrode
21
having a large-diameter electron beam passing hole, and an inner electrode
22
disposed within the outer electrode
21
and having polygonal small-diameter electron beam passing holes
22
R,
22
G and
22
B. Here, aberration generated by the large-diameter electron beam passing hole can be corrected by the polygonal small-diameter electron beam passing holes
22
R,
22
G and
22
B. However, it is not easy to fabricate the polygonal small-diameter electron beam passing holes
22
R,
22
G and
22
B.
Another conventional large-diameter electrode unit is shown in
FIG. 5
, in which electron beam passing holes
32
R,
32
G and
32
B of an inner electrode
31
are vertically elongated. However, it is difficult to fabricate an electron gun having this type of electrode due to the vertically elongated electron beam passing holes.
SUMMARY OF THE INVENTION
To solve the above problems, it is an objective of the present invention to provide an electrode of an electron gun for a color cathode ray tube which can easily correct aberration of an electronic lens formed by a large-diameter electron beam passing hole and improve focusing characteristics.
Accordingly, to achieve the above objective, there is provided an electrode unit of an electron gun for a cathode ray tube including an outer rim electrode having a large-diameter electron beam passing hole through which three electron beams pass, and an inner electrode installed within the outer rim electrode and having a central electron beam passing hole disposed at its center and side electron beam passing holes disposed at opposite sides of the central electron beam passing hole, the side electron beam passing holes having first and second curved portions in which the sides close to the central electron beam passing hole and the sides facing thereto have predetermined curvatures, and linear portions connecting the first and second curved portions, the vertical width and the horizontal width of the side electron beam passing holes being equal to each other.
In the present invention, a flange inwardly extending from the top end of the outer rim electrode to thus define the shape of the large-diameter electron beam passing hole is preferably formed. The first curved portions preferably have curvatures of an ellipse and the second curved portions have curvatures of a circle.
REFERENCES:
patent: 4370592 (1983-01-01), Hughes et al.
patent: 4583024 (1986-04-01), Chen
patent: 4626738 (1986-12-01), Gerlach
patent: 5414323 (1995-05-01), Uchhi
Hong Young-gon
Kim Deok-ho
Kim Kyung-ho
Kwon Yong-geol
Yoon Kwang-jin
Berck Ken A
Leydig , Voit & Mayer, Ltd.
Patel Vip
Samsung SDI Co., LTD
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