Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-04-12
1990-02-06
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324158P, G01R 2726
Patent
active
048991023
ABSTRACT:
A parallel plate dielectric analyzer is disclosed including:
REFERENCES:
patent: 3488758 (1970-01-01), Benson, Jr. et al.
patent: 3613454 (1971-10-01), McFadin
patent: 4103275 (1978-07-01), Diehl et al.
patent: 4129848 (1978-12-01), Frank et al.
patent: 4311549 (1982-01-01), Vercillo
patent: 4559797 (1985-12-01), Raymond
Hendrick Kendall B.
Reader, Jr. John R.
E. I. Du Pont de Nemours and Company
Eisenzopf Reinhard J.
Lynn John M.
Miele Anthony L.
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