Electrode structure for capacitance-type measurement transducers

Details Electrode structure for capacitance-type measurement transducers Electrode structure for capacitance-type measurement transducers

1992-09-24

1994-09-27

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324660, 34087037, 341 15, G01R 2726

Patent

active

RE0347418

ABSTRACT:
A capacitance-type measuring apparatus includes first and second support members which are movable with respect to one another along a measurement axis; a first electrode array and a second electrode disposed on the first support member; and a third electrode array disposed on the second support member and capacitively coupling the first electrode array and second electrode for transmission of a signal between the first electrode array and second electrode through the third electrode array. One of the first electrode array or the second electrode is formed to have end portions configured such that the degree of coupling between the first electrode array and second electrode through the third electrode array decreases linearly along the extent of each end portion relative to the measurement axis. This configuration permits improved measurement accuracies by reducing the effects of tilt between the first and second support members which changes the spacing between such members along the axis of measurement.

REFERENCES:
patent: 3860918 (1975-01-01), Cencel
patent: 4177421 (1979-12-01), Thornburg
patent: 4303919 (1981-12-01), Dimeff
patent: 4410852 (1983-10-01), Guretzky
patent: 4434391 (1984-02-01), Swartz et al.
patent: 4733235 (1988-03-01), Baer et al.

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