Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2006-03-07
2008-11-25
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE31029, C438S095000
Reexamination Certificate
active
07456420
ABSTRACT:
An electrode for a memory material of a phase change memory device is disclosed. The electrode includes a first layer adhered to the memory material, the first layer including a nitride (ANx), where A is one of titanium (Ti) and tungsten (W) and x greater than zero, but is less than 1.0, and a second layer adhered to the first layer, the second layer including a nitride (ANy), where y is greater than or equal to 1.0. The multiple layer electrode allows the first layer to better adhere to chalcogenide based memory material, such as GST, than for example, stoichiometric TiN or WN, which prevents delamination. A phase change memory device and method are also disclosed.
REFERENCES:
patent: 6744088 (2004-06-01), Dennison
patent: 6764984 (2004-07-01), Beatty
patent: 6791102 (2004-09-01), Johnson et al.
patent: 6797979 (2004-09-01), Chiang et al.
patent: 6830952 (2004-12-01), Lung
patent: 7259040 (2007-08-01), Pellizer et al.
patent: 2003/0155655 (2003-08-01), Fitzsimmons et al.
patent: 2005/0029502 (2005-02-01), Hudgens
patent: 2006/0234502 (2006-10-01), Bhat et al.
patent: 2006/0278900 (2006-12-01), Chang et al.
Y.N. Hwang, et al., “Completely CMOS-Compatible Phase-Change Nonvolatile RAM Using NMOS Cell Transistors,” Samsung Electronics Co., Ltd., pp. 91-92.
Dave Bursky, “Nonvolatile Memory: More Than A Flash In The Pan.” ED Online ID #5267, Jul. 2003, pp. 1-3.
Cote Donna R.
Hon Wong Keith Kwong
Mauthe Ronald W.
Capella Steven
Hoffman Warnick LLC
International Business Machines - Corporation
Pert Evan
Sandvik Ben P
LandOfFree
Electrode for phase change memory device and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrode for phase change memory device and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrode for phase change memory device and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4021456