Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Erosion
Patent
1975-01-10
1976-08-17
Rolinec, R. V.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Erosion
204 1T, 204195R, 324 54, G01N 2702, G01N 2726
Patent
active
039756815
ABSTRACT:
An electrode structure comprising a tube of substantially electrically insulating material such as glass, having a rounded tip of substantially electrically insulating material such as rubber, which tip has a capillary opening therethrough, encloses a metallic cathode and liquid electrolyte, and that electrode structure is placed with the tip and capillary opening in contact with the surface of a sample conductive substrate having an electrical barrier layer thereon whose thickness is to be measured, and electrical potential is applied between the cathode and sample conductive substrate, which is the anode in the system, and the thickness of the electrical barrier layer is measured as a function of the highest applied voltage that does not produce a pronounced increase in current flow in the system.
REFERENCES:
patent: 2345498 (1944-03-01), Perley
patent: 2497052 (1950-02-01), Williams
patent: 2894882 (1959-07-01), Strodtz
patent: 3293155 (1966-12-01), Stone
patent: 3315270 (1967-04-01), Hersch
patent: 3445366 (1969-05-01), Vermeer
Angelini Dominic J.
Perry Philip G.
Rolinec R. V.
Sunderdick Vincent J.
Xerox Corporation
LandOfFree
Electrode for measuring thickness of dielectric layers on conduc does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrode for measuring thickness of dielectric layers on conduc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrode for measuring thickness of dielectric layers on conduc will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1488577