Electroconductive contact probe with intermediately supported, s

Details Electroconductive contact probe with intermediately supported, s Electroconductive contact probe with intermediately supported, s

1993-02-04

1995-02-28

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 100

Patent

active

053940997

ABSTRACT:
A contact probe unit includes a plurality of contact probes secured to a receptacle holder plate member, and a free end guide plate member provided with a plurality of guide holes for slidably receiving the needle members, at a density higher than that of the contact probes at the receptacle holder plate member, and at least one intermediate guide plate member disposed between the free end guide plate member and the receptacle holder plate member so as to allow an axial movement to the needle members and provide a lateral support to the needle members. Thereby, each of the needle members can be favorably guided for axial movement between the receptacle holder plate member and the free end guide plate member so as to eliminate the possibility of two adjacent needle member touching each other in the region between the receptacle holder plate member and the free end guide plate member, and improve the durability of the needle members. Further, the process of fabrication can be simplified because the efforts required for passing each needle member through the corresponding guide hole of the free end guide plate member are substantially reduced by the provision of the intermediate guide plate member.

REFERENCES:
patent: 4423376 (1983-12-01), Byrnes et al.
patent: 4535536 (1985-08-01), Wyss
patent: 4544888 (1985-10-01), Kvaternik
patent: 4633176 (1986-12-01), Reiner
patent: 4686467 (1987-08-01), DeLapp et al.
patent: 4896107 (1990-01-01), Maelzer et al.
patent: 5003255 (1991-03-01), Kazama
patent: 5004977 (1991-04-01), Kazama

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