Electrochemical planarization

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437203, 437230, 437245, 437170, 437187, 437194, H01L 21465

Patent

active

052565653

ABSTRACT:
In a process for fabricating planarized thin film metal interconnects for integrated circuit structures, a planarized metal layer is etched back to the underlying dielectric layer by electropolishing, ion milling or other procedure. Electropolishing reduces processing time from hours to minutes and allows batch processing of multiple wafers. The etched back planarized thin film interconnect is flush with the dielectric layer.

REFERENCES:
patent: 3849270 (1974-11-01), Takagi et al.
patent: 4462856 (1984-07-01), Abe et al.
patent: 4475983 (1984-10-01), Bader et al.
patent: 4624749 (1986-11-01), Black et al.
patent: 4674176 (1987-06-01), Tuckerman
patent: 4681795 (1987-07-01), Tuckerman
patent: 4692349 (1987-09-01), Georgiou et al.
patent: 4696729 (1987-09-01), Santini
patent: 4729940 (1988-03-01), Nee et al.
patent: 4789648 (1988-12-01), Chow et al.
patent: 4808545 (1989-02-01), Balasubramanyam et al.
patent: 4855252 (1989-08-01), Peterman et al.
patent: 4874493 (1989-10-01), Pan
patent: 4876223 (1989-10-01), Yoda et al.
patent: 4915983 (1990-04-01), Lake et al.
patent: 4944836 (1990-07-01), Beyer et al.
patent: 5096550 (1992-03-01), Mayer et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electrochemical planarization does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrochemical planarization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrochemical planarization will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-958784

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.