Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-08-08
2006-08-08
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S718000, C702S035000
Reexamination Certificate
active
07088115
ABSTRACT:
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.
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Glenn Anne W.
Glenn David F.
Matthern Gretchen E.
Propp W. Alan
Shaw Peter G.
Battelle Energy Alliance, LLC
Deb Anjan
Nguyen Hoai-An D.
Wells St. John P.S.
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