Electro-optical plasma probe

Optics: measuring and testing – For light transmission or absorption – Of fluent material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01N 2100

Patent

active

060347813

ABSTRACT:
A plasma probe enables simultaneous localized electrostatic measurements and optical emission spectroscopy. The probe has a support arm with an elongated longitudinally extending section and a bend section at the end of which is supported an electrical probe element composed of back-to-back charge collection plates separated by an insulating spacer. The inner plate faces an opening in the end of the elongated support arm section which defines a collimating channel. An optical fiber extends through the support arm and has an aperture in the collimating channel to receive light emitted from the plasma between the end of the elongated section of the support arm and the inner charge collection plate. The electrical probe element acts as a blocking element to block light emitted from the plasma outside of the region between the electrical probe element and the end of the support arm section. Electrical wires extend through the probe from the charge collection plates to charge detectors, allowing measurements of electron density, Electron Energy Distribution Function and ion flow. The light received by the optical fiber is detected by a spectrometer to carry out Optical Emission Spectroscopy, which can be correlated with the information obtained from the charge collection plates. The probe can be moved around a plasma confinement chamber to provide spatially localized measurements of plasma characteristics at various positions within the chamber.

REFERENCES:
patent: 3292079 (1966-12-01), Schindler
patent: 3356885 (1967-12-01), Beck
patent: 4637729 (1987-01-01), Schoch
patent: 4859277 (1989-08-01), Barna et al.
patent: 5085499 (1992-02-01), Griffin et al.
patent: 5339039 (1994-08-01), Carlile et al.
patent: 5359282 (1994-10-01), Teii et al.
patent: 5448173 (1995-09-01), Shinohara et al.
patent: 5500076 (1996-03-01), Jerbic
patent: 5523955 (1996-06-01), Heckman
patent: 5570175 (1996-10-01), Dobele et al.
patent: 5627640 (1997-05-01), Chang et al.
patent: 5652810 (1997-07-01), Tipton et al.
patent: 5653811 (1997-08-01), Chan
G. Fiksel, et al., An Optical Probe For Local Measurements of Fast Plasma Ion Dynamics, Review of Scientific Instruments, vol. 69, No. 5, May, 1998, pp. 2024-2026.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electro-optical plasma probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electro-optical plasma probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electro-optical plasma probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-368361

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.