Electro-optical device, electronic apparatus, and mounting...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Reexamination Certificate

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11159728

ABSTRACT:
An electro-optical device includes a first substrate that holds an electro-optical material, a first IC that is mounted on the first substrate and that has a plurality of first terminals, a plurality of second terminals formed on the first substrate to be connected to the first terminals, respectively, a plurality of wiring lines formed on the first substrate, first substrate crack diagnostic terminal pairs that are included in the plurality of the first terminals and that are used for diagnosing whether a crack occurs in the first substrate, second substrate crack diagnostic terminal pairs that are included in the plurality of second terminals and that are connected to the first substrate crack diagnostic terminal pairs, respectively, a substrate crack diagnostic conductive pattern that connects the second substrate crack diagnostic terminal pairs and that extends around an outer periphery of the first substrate, a substrate crack diagnostic unit provided in the first IC to diagnose whether the first substrate crack diagnostic terminal pairs are electrically connected to each other, and a substrate crack diagnosis result output unit provided in the first IC to output a diagnosis result obtained by the substrate crack diagnostic unit.

REFERENCES:
patent: 4835466 (1989-05-01), Maly et al.
patent: 5969532 (1999-10-01), Usui et al.
patent: 5994916 (1999-11-01), Hayashi
patent: 6291834 (2001-09-01), Hasegawa
patent: 6420883 (2002-07-01), Watanabe et al.
patent: 01-232326 (1989-09-01), None
patent: 05-315418 (1993-11-01), None
patent: 05-346587 (1993-12-01), None
patent: 06-082802 (1994-03-01), None
patent: 2000-276369 (2000-10-01), None
patent: 2003-057677 (2003-02-01), None

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