Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-07-17
2007-07-17
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
11159728
ABSTRACT:
An electro-optical device includes a first substrate that holds an electro-optical material, a first IC that is mounted on the first substrate and that has a plurality of first terminals, a plurality of second terminals formed on the first substrate to be connected to the first terminals, respectively, a plurality of wiring lines formed on the first substrate, first substrate crack diagnostic terminal pairs that are included in the plurality of the first terminals and that are used for diagnosing whether a crack occurs in the first substrate, second substrate crack diagnostic terminal pairs that are included in the plurality of second terminals and that are connected to the first substrate crack diagnostic terminal pairs, respectively, a substrate crack diagnostic conductive pattern that connects the second substrate crack diagnostic terminal pairs and that extends around an outer periphery of the first substrate, a substrate crack diagnostic unit provided in the first IC to diagnose whether the first substrate crack diagnostic terminal pairs are electrically connected to each other, and a substrate crack diagnosis result output unit provided in the first IC to output a diagnosis result obtained by the substrate crack diagnostic unit.
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Hasegawa Kenichi
Tsuda Atsunari
Harness & Dickey & Pierce P.L.C.
Nguyen Ha Tran
Nguyen Tung X.
Seiko Epson Corporation
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