Electro-optical device, driving circuit, and electronic...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...

Reexamination Certificate

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C257S059000, C257S350000

Reexamination Certificate

active

11008998

ABSTRACT:
To prevent an electrostatic discharge in transistors constituting a driving circuit built in a substrate. The shift register and the level shifter constituting a scanning line driving circuit include TFT elements respectively which employing the polysilicon layer formed on the element substrate as a semiconductor layer. Each TFT element constituting the level shifter has a gate electrode opposing the channel region of the polysilicon layer with an insulating layer interposed therebetween. Each polysilicon layer is shared by a plurality of TFT elements with being separated from each other. The total area ‘S’ of each polysilicon layer which opposes the gate electrode of the TFT element is 3000 μm2or less.

REFERENCES:
patent: 5426320 (1995-06-01), Zambrano
patent: 6333520 (2001-12-01), Inoue
patent: 6677609 (2004-01-01), Inoue
patent: 6790755 (2004-09-01), Jeon
patent: 7038279 (2006-05-01), Kraz et al.
patent: 2002/0047550 (2002-04-01), Tanada
patent: 2003/0103181 (2003-06-01), Imayama et al.

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