Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2005-10-11
2005-10-11
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S072000, C257S294000, C257S457000, C257S749000
Reexamination Certificate
active
06953949
ABSTRACT:
An electro-optical device according to the present invention includes, above a substrate, pixel electrodes, thin film transistors connected to the pixel electrodes, an upper light shielding film to cover the upper side of the channel regions of the thin film transistors, and a lower light shielding film to cover the lower side of the channel regions of the thin film transistors. Each of the upper light shielding film and the lower light shielding film has projecting portions to define corner cuts in an opening region of each pixel, in the intersection regions where data lines and scanning lines intersect each other. Both projecting portions are connected to each other through contact holes. The channel region of the thin film transistors are disposed in the intersection regions.
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