Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-02-06
1997-04-29
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 96, G01R 31308, G01R 3102
Patent
active
056252960
ABSTRACT:
A processing unit notifies a drive unit of a designated number N (=1, 2, . . . ). The drive unit supplies a drive signal of a frequency f.sub.0 to a target measurement device, and supplies a modulation signal of a frequency N.multidot.f.sub.0 +.DELTA.f to an optical modulator. In this state, a continuous emission light beam is emitted from a light source, incident on an E-O probe sequentially through a polarizer and a first optical system, influenced by a periodical voltage waveform generated at a target measurement portion at a fundamental period 1/f.sub.0 to modulate the polarized state, and output from the E-O probe. The optical signal whose polarized state is modulated is input to the optical modulator and modulated. Thereafter, a polarization direction is selected by an optical selection unit, and the optical signal is input to an photodetector 510 and heterodyne-detected. The processing unit reproduces the waveform of the voltage signal generated at the target measurement portion by calculation of Fourier transform on the basis of the obtained photodetection signal and displays the waveform.
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Valdmanis et al, "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.
Kamiya Takeshi
Takahashi Hironori
Tsuchiya Yutaka
Hamamatsu Photonics K.K.
Karlsen Ernest F.
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