Electro-optic voltage detector

Details Electro-optic voltage detector Electro-optic voltage detector

1994-09-28

1995-12-26

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 96, G01R 3128, G01R 3100

Patent

active

054791065

ABSTRACT:
To provide an E-O probe which can measure a voltage distribution in a fine region while enlarging it. A grounded, transparent electrode 2 and an electrooptic member 3 such as LiTaO.sub.3 are successively fixed to and below a support 1. There are a plurality of conical, conductive members 5a-5e arranged below a reflection film 4 in such a manner that the bottom surfaces thereof are fixed to the lower surface of the reflection film 4 and that the lower ends thereof project downward. Spaces between the plural, linear, electric needles 5a-5e become narrower toward a measured object located below them, whereby voltages in a fine region in the measured object can be guided as enlarged to the electrooptic member 3.

REFERENCES:
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patent: 4996475 (1991-02-01), Takahashi et al.
patent: 5041783 (1991-08-01), Ohta et al.
patent: 5394098 (1995-02-01), Meyrueix et al.
Valdmanis et al, "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.
Kolner et al, "Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.
Kolner et al, "Electrooptic Sampling in GaAs Integrated Circuits", IEEE Journal of Quantum Electronics, QE-22, No. 1, Jan. 1986, pp. 79-93.
Valdmanis, "Electro-Optic Measurement Techniques for Picosecond Materials, Devices, and Integrated Circuits", Semiconductors and . . . , vol. 23, pp. 135-219.
Patent Abstracts of Japan, vol. 17, No. 231 (P-1532) May 11, 1993 & JP-04 359 162 (Fujitsu) Dec. 11, 1992.

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