Electro-optic time domain reflectometry

Details Electro-optic time domain reflectometry Electro-optic time domain reflectometry

2007-10-09

2007-10-09

Nguyen, Tu T. (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

11472640

ABSTRACT:
Apparatuses, methods, and systems associated with and/or having components capable of, isolating defects in microelectronic packages are disclosed herein. In various embodiments, a defect-isolation apparatus may include an optoelectronic module to convert an optical test signal to an electrical test signal and provide the electrical test signal to a device under test; an electro-optic probe including an electro-optic crystal to polarize an optical sampling signal upon application of an electrical test signal reflected from the device under test to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the device under test.

REFERENCES:
patent: 4603293 (1986-07-01), Mourou et al.
patent: 5321632 (1994-06-01), Otsuji et al.
patent: 5376888 (1994-12-01), Hook
patent: 5585913 (1996-12-01), Hariharan et al.
patent: 5726578 (1998-03-01), Hook
patent: 6104200 (2000-08-01), Hook
patent: 6524871 (2003-02-01), Okawauchi
patent: 6542228 (2003-04-01), Hartog
patent: 7005995 (2006-02-01), Hornsby et al.
patent: 2005/0270530 (2005-12-01), Wada et al.

Affiliated with

Also associated with

Rating

Electro-optic time domain reflectometry does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electro-optic time domain reflectometry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electro-optic time domain reflectometry will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3899847