Electro-optic sampling system clock and stimulus pattern generat

Details Electro-optic sampling system clock and stimulus pattern generat Electro-optic sampling system clock and stimulus pattern generat

1988-09-01

1992-03-10

Wieder, Kenneth A.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 27, G01R 3100

Patent

active

050952625

ABSTRACT:
A high-speed electro-optic test system for testing high-speed electronic devices and integrated circuits is provided with a precision programmable reference clock source providing clock pulses for accurately timing a stimulus pattern in precise synchronism with optical sampling pulses. The clock source includes a frequency synthesizer having a programmed output frequency and precision delay features. The stimulus pattern clock frequency and pattern length can be programmed to facilitate maximum throughput for devices being tested in the electro-optic system.

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