Electro-optic probe

Details Electro-optic probe Electro-optic probe

1999-05-25

2000-12-26

Dang, Hung Xuan

Optical: systems and elements

Optical modulator

Light wave temporal modulation

359251, G02F 103

Patent

active

061668451

ABSTRACT:
The present invention relates to a probe for an electro-optic sampling oscillator.
The probe for an electro-optic sampling oscillator provides a laser diode that generates a laser beam based on the control signal of the electro-optical sampling oscilloscope; a collimator lens that makes the laser beam into a parallel beam; an electro-optic element that has a reflecting film at the end; an isolator provided between the collimator lens and the electro-optic element that passes the laser beam that is generated by the laser diode and separates the reflected beam of the laser beam that was reflected by the reflecting film; photodiodes that convert the reflected beam separated by the isolator into an electrical signal; and a condenser lens provided between the isolator and the electro-optic element that condenses the parallel beam to one point on the reflecting film, makes the reflected beam reflected by the reflecting film into a parallel beam again, and makes the optical axes of the light incident on the reflecting film and the light reflected by the reflecting film coincide.

REFERENCES:
patent: 5724459 (1998-03-01), Banba et al.
M. Shinagawa, et al., "A High-Impedance Probe Based on Electro-Optic Sampling," Proceedings of 15th Meeting on Lightwave Sensing Technology, LST May, 15-17, 1995.

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