Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2006-09-07
2009-12-29
Lee (Andrew), Hwa S (Department: 2886)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
07639363
ABSTRACT:
An Electro-Optic Imaging Fourier Transform Spectrometer (EOIFTS) for Hyperspectral Imaging is described. The EOIFTS includes an input polarizer, an output polarizer, and a plurality of birefringent phase elements. The relative orientations of the polarizers and birefringent phase elements can be changed mechanically or via a controller, using ferroelectric liquid crystals, to substantially measure the spectral Fourier components of light propagating through the EIOFTS. When achromatic switches are used as an integral part of the birefringent phase elements, the EIOFTS becomes suitable for broadband applications, with over 1 micron infrared bandwidth.
REFERENCES:
patent: 6421131 (2002-07-01), Miller
patent: 6992777 (2006-01-01), Han et al.
Chao Tien-Hsin
Znod Hanying
California Institute of Technology
Lee (Andrew) Hwa S
Tope-McKay & Associates
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