Electrically programmable semiconductor device with concurrent p

Static information storage and retrieval – Floating gate – Particular biasing

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36518503, 3651852, 3651854, G11C 1604

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active

061412538

ABSTRACT:
An electronically programmable semiconductor memory device that concurrently programs floating gate memory cells in the semiconductor memory device and verifies the programming of the memory cells is disclosed. Source-side voltage monitoring of the memory cells is used to verify programming concurrently with the programming of the memory cells. Threshold voltages of the memory cells are able to be programmed to three or more distinct voltage levels. Only a limited amount of die area is needed to obtain both high speed programming and concurrent verification.

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