Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2005-11-29
2005-11-29
Cao, Phat X. (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257S758000, C438S095000
Reexamination Certificate
active
06969866
ABSTRACT:
A memory element comprising a volume of phase change memory material; and first and second contact for supplying an electrical signal to the memory material, wherein the first contact comprises a conductive sidewall spacer. Alternately, the first contact may comprise a contact layer having an edge adjacent to the memory material.
REFERENCES:
patent: 5414271 (1995-05-01), Ovshinsky et al.
patent: 5687112 (1997-11-01), Ovshinsky
patent: 5714768 (1998-02-01), Ovshinsky et al.
patent: 6031287 (2000-02-01), Harshfield
patent: 6064084 (2000-05-01), Tanahashi
patent: 6194746 (2001-02-01), Gonzalez et al.
patent: 6258707 (2001-07-01), Uzoh
patent: 6307264 (2001-10-01), Fukumoto
patent: 6423621 (2002-07-01), Doan et al.
Czubatyj Wolodymyr
Klersy Patrick J.
Kostylev Sergey A.
Lowrey Tyler
Ovshinsky Stanford R.
Cao Phat X.
Ovonyx Inc.
Schlazer Philip H.
Siskind Marvin S.
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