Electrically programmable interconnect element for integrated ci

Details Electrically programmable interconnect element for integrated ci Electrically programmable interconnect element for integrated ci

1994-06-16

1995-09-19

Hille, Rolf

Active solid-state devices (e.g., transistors, solid-state diode

Integrated circuit structure with electrically isolated...

Passive components in ics

257208, 257209, 257529, 257750, H01L 2702, H01L 2348

Patent

active

054518113

ABSTRACT:
A user-programmable interconnect device includes a first lower electrode comprising a conductive material. A layer of dielectric material is disposed over the top surface of the lower conductor. An antifuse material, such as one or more layers of a dielectric material, amorphous silicon, or combinations of such materials, is located in an aperture in the dielectric material where the interconnect element of the present invention is to be formed. A second, upper electrode of conductive material is formed over the top of the antifuse material. A portion of the upper electrode located immediately above the antifuse material is fabricated as a fuse material. A passivation layer covers the second electrode and may have an aperture located therein at a location immediately above the antifuse and fuse material. Electrical connections to circuitry incorporating the interconnect element of the present invention are made to the lower and upper electrodes.

REFERENCES:
patent: 4441167 (1984-04-01), Principi
patent: 4758745 (1988-07-01), Elgamal et al.
patent: 4796075 (1989-01-01), Whitten
patent: 4823181 (1989-04-01), Mohsen et al.
patent: 4847732 (1989-07-01), Stopper et al.
patent: 4870302 (1989-09-01), Freeman
patent: 4894705 (1990-01-01), Kamuro
patent: 4899285 (1990-02-01), Nakayama et al.
patent: 4908692 (1990-03-01), Kikuchi et al.
patent: 4912066 (1990-03-01), Wills
patent: 4947020 (1990-08-01), Imamura et al.
patent: 4968643 (1990-11-01), Mukai
patent: 5017510 (1991-05-01), Welch et al.
patent: 5070384 (1991-12-01), McCollum et al.

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