Electrical testing probe assembly having nonparallel facing...

Details Electrical testing probe assembly having nonparallel facing... Electrical testing probe assembly having nonparallel facing...

2008-06-13

2009-11-17

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07619430

ABSTRACT:
Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facing surface. The first and second facing surfaces are configured to face a test object, and substantially nonparallel to each other. The probe assembly has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe.

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