Electrical testing apparatus having masked sockets and...

Details Electrical testing apparatus having masked sockets and... Electrical testing apparatus having masked sockets and...

2008-05-02

2010-12-28

Ta, Tho D (Department: 2839)

Electrical connectors

Coupling part having handle or means to move contact...

C439S331000, C439S526000, C439S924100, C439S070000

Reexamination Certificate

active

07857646

ABSTRACT:
An apparatus for forming a temporary electrical connection with a microelectronic component and associated systems and methods are disclosed herein. Embodiments of the apparatus can include a base, a plurality of electrical contacts coupled to the base, and a nest attached to the base. The nest includes a plurality of contact compartments aligned with peripheral leads of the microelectronic component and at least partially covering the contacts. Individual contact compartments are masked to prevent a corresponding contact from electrically contacting the peripheral leads of the microelectronic component. In one embodiment, the masked contact compartments are used as a guide zone to guide individual peripheral leads when the microelectronic component is seated at or unseated from the support surface. In an additional or alternative embodiment, the masked contact compartments are used to selectively isolate contacts, for example, from supply or ground electrical potentials.

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