Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-01-10
2009-06-09
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S756010
Reexamination Certificate
active
07545159
ABSTRACT:
Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
REFERENCES:
patent: 3435168 (1969-03-01), Cooney
patent: 3562643 (1971-02-01), Smith
patent: 4773877 (1988-09-01), Kruger et al.
patent: 5003255 (1991-03-01), Kazama
patent: 5084673 (1992-01-01), Kazama
patent: 5115563 (1992-05-01), Wilson
patent: 5744977 (1998-04-01), Cuautla
patent: 6053777 (2000-04-01), Boyle
patent: 6159056 (2000-12-01), Boyle
patent: 6275054 (2001-08-01), Boyle
patent: 6377059 (2002-04-01), Vinther et al.
patent: 6398592 (2002-06-01), Mori et al.
patent: 6462567 (2002-10-01), Vinther et al.
patent: 6506082 (2003-01-01), Meek et al.
patent: 6652326 (2003-11-01), Boyle et al.
patent: 6667629 (2003-12-01), Souza et al.
patent: 6685492 (2004-02-01), Winter et al.
patent: 6844749 (2005-01-01), Sinclair
patent: 6922496 (2005-07-01), Morris
patent: 7025602 (2006-04-01), Hwang
patent: 7025630 (2006-04-01), Laverick
patent: 7253647 (2007-08-01), Lee
patent: 7256593 (2007-08-01), Treibergs
patent: 0245787 (1987-11-01), None
patent: 0405323 (1991-01-01), None
patent: 2003172747 (2003-06-01), None
International Search Report and Written Opinion; International Application No. PCT/US2007/012375; International Filing Date May 23, 2007; Applicant's file reference RIK-0021-PCT; Date of mailing Apr. 12, 2007; 13 pages.
EP0405323; Jan. 2, 1991; Michael Seeliger; English abstract only; 3 pages.
EP0245787; Nov. 19, 1987; Klaus Giringer; English abstract only; 4 pages.
JP2003172747; Jun. 20, 2003; Kamiya Takeshi; English abstract only; 1 page.
Introducing the Titanium Pro ICT Series, Path to Peak Performance; IDI; Catalog and Source Book; Sixth Edition; pp. 42-47, Released: Aug. 1, 2000.
Benitez Joshua
Cantor & Colburn LLP
Nguyen Ha Tran T
Rika Denshi America, Inc.
LandOfFree
Electrical test probes with a contact element, methods of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrical test probes with a contact element, methods of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical test probes with a contact element, methods of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4060649