Electrical test probes, methods of making, and methods of using

Details Electrical test probes, methods of making, and methods of using Electrical test probes, methods of making, and methods of using

2008-01-01

2008-01-01

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07315176

ABSTRACT:
Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.

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JP 2001-255340; Sep. 21, 2001; English abstract only; (2pgs).
JP 2004-069508; Mar. 4, 2004; English abstract only; (1pg).

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