Electrical test probe wedge tip

Details Electrical test probe wedge tip Electrical test probe wedge tip

2000-07-31

2001-07-03

Davis, Antoine Duval (Department: 2913)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0444401

CLAIM:
The ornamental design for an electrical test probe wedge tip, as shown and described.

REFERENCES:
patent: D. 427091 (2000-06-01), Suurmeijer
patent: D. 427535 (2000-07-01), Suurmeijer

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