Electrical test probe having a spring biased clip with an extend

Details Electrical test probe having a spring biased clip with an extend Electrical test probe having a spring biased clip with an extend

1977-04-13

1979-04-24

Corcoran, Robert J.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

339 31T, 339108TP, 339261, G01R 3102

Patent

active

041514629

ABSTRACT:
A normally retracted tip is extendible intermediate spring biased jaws of an electrical probe and is retained in the extended position by a spring bias and the gripping action of the jaws. The housing for the probe includes a compartment for containing interchangeable active or passive circuitry operative upon the signal sensed by the probe or a signal injected thereto from the probe. Apparatus for checking the electrical continuity through the probe is also disposed within the housing. A socket which provides both electrical and structural interconnection between the probe and an attached electrical conductor(s) is disposed at the rear of the housing.

REFERENCES:
patent: 2918646 (1959-12-01), Davidson
patent: 3821689 (1974-06-01), Graham

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