Electrical connectors – With insulation other than conductor sheath – Plural-contact coupling part
Reexamination Certificate
2005-03-08
2005-03-08
Paumen, Gary (Department: 2833)
Electrical connectors
With insulation other than conductor sheath
Plural-contact coupling part
C439S824000
Reexamination Certificate
active
06863576
ABSTRACT:
An electrical test probe tip, comprising a conductive flexible coil having a first end and a second end. The first end is for flexibly coupling with a device to be probed. The second end is attached to a connector. The connector may be an integral connection with a probing head or may be a connecting pin. Multiple test probe spring tips may be used to simultaneously probe signal and ground reference points. The present invention is also directed to a method for using the flexible spring tip.
REFERENCES:
patent: 3072877 (1961-05-01), Landwehr
patent: 3676776 (1972-07-01), Bauer et al.
patent: 3885848 (1975-05-01), Brouneus
patent: 4740746 (1988-04-01), Pollock et al.
patent: 4773877 (1988-09-01), Kruger et al.
patent: 4978312 (1990-12-01), Fodali
patent: 5151040 (1992-09-01), Tanaka
patent: 5967856 (1999-10-01), Meller
patent: 5982187 (1999-11-01), Tarzwell
patent: 5997360 (1999-12-01), Gen-Kuong et al.
patent: 6083059 (2000-07-01), Kuan
patent: 6447343 (2002-09-01), Zhang et al.
patent: 6464511 (2002-10-01), Watanabe et al.
Tektronix, Instruction Manual, P6245, 1.5 GHz 10X Active Probe, 070-8995-01, Tektronix, Inc., Wilsonville, Oregon, USA.
Campbell Julie A.
Jacobs Lawrence W.
LeCroy Corporation
Oster Karen Dana
Paumen Gary
LandOfFree
Electrical test probe flexible spring tip does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrical test probe flexible spring tip, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical test probe flexible spring tip will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3400325