Electrical test probe

Details Electrical test probe Electrical test probe

2005-08-09

2009-12-08

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07629807

ABSTRACT:
A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electrode of a device under test, the main portion being made of a tenacity material. The main portion includes a conductive material extending from the base end to the tip end and at least part of which is buried within the tenacity material, and the tenacity material has higher resiliency than that of the conductive material while the conductive material has higher conductivity than that of the tenacity material. As a result, disorder of a signal provided via the probe is decreased without losing elastic deformation.

REFERENCES:
patent: 5448016 (1995-09-01), DiPaolo et al.
patent: 6033233 (2000-03-01), Haseyama et al.
patent: 6573738 (2003-06-01), Matsuo et al.
patent: 6624648 (2003-09-01), Eldridge et al.
patent: 6920689 (2005-07-01), Khandros et al.
patent: 2002/0008530 (2002-01-01), Kim et al.
patent: 2002/0060579 (2002-05-01), Haseyama et al.
patent: 11-162270 (1999-06-01), None
patent: 2000-111577 (2000-04-01), None
patent: 2000-338131 (2000-12-01), None
patent: 2001-337110 (2001-12-01), None
patent: 2004-150874 (2004-05-01), None
patent: 2004-340617 (2004-12-01), None
patent: 2004-340654 (2004-12-01), None

Affiliated with

Also associated with

Rating

Electrical test probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrical test probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical test probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4092105