Electrical test device

Details Electrical test device Electrical test device

2007-01-16

2007-01-16

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

11127901

ABSTRACT:
An electrical test device, in particular for testing wafers, having a contact head, which is associated with the test object and is provided with pin-shaped contact elements that are arrayed to form a contact pin arrangement. An electrical connection apparatus, including contact faces which are in touching contact with ends of the contact elements which face away from the test object. A centering device, which permits only radial play for thermal expansion by sliding guides, for centrally aligning the contact head and the connection apparatus with respect to one another.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 5949244 (1999-09-01), Miley
patent: 6710615 (2004-03-01), Miki
patent: 6759842 (2004-07-01), Weimer
patent: 6822466 (2004-11-01), Holcombe et al.
patent: 2003/0085721 (2003-05-01), Eldridge et al.

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