Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-09-17
1996-03-19
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, 324761, G01R 1073
Patent
active
055006051
ABSTRACT:
The invention is a method for testing an electronic device (10) of the type having on one side thereof an array of conductive projections, such as solder balls (15), arranged in a first configuration. An array of spring-loaded probes (25) is arranged in the first configuration. An insulative template (18) is formed comprising an array of apertures (19) arranged in the first configuration which is aligned with the spring-loaded conductive probes. The electronic device (10) is then forced against the template (18) such that each solder ball (15) projects into the aperture to contact a spring-loaded conductive probe (25). Electrical current is passed through at least part of the electronic device, at least some of the solder balls, and at least some of the conductive probes as is required for electrical testing of the electronic device.
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Anderson Roderick B.
AT&T Corp.
Brown Kenneth M.
Karlsen Ernest F.
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