Electrical temperature measuring resistor structure, particularl

Details Electrical temperature measuring resistor structure, particularl Electrical temperature measuring resistor structure, particularl

1976-06-14

1977-09-20

Padgett, Benjamin R.

Electrical resistors

With base extending along resistance element

Resistance element coated on base

338 25, 338 28, 338307, 338314, H01C 1012, H01C 304

Patent

active

040500527

ABSTRACT:
A substrate carrier of electrically non-conductive material has a strip of resistance platinum applied thereto; in order to avoid the use of an intermediate temperature coefficient of expansion matching layer, the substrate carrier, for example of aluminum oxide, beryllium oxide, or a magnesium silicate, has less than thirty parts per million (ppm) Fe, less than 15 ppm Cr, less than 45 ppm Pb and less than 70 ppm Si in a form capable of reacting with platinum, the sum of the impurities by these metals, if all, or more than one are present, not exceeding 20 ppm; the average thermal coefficient of expansion of the substrate does not deviate from the mean thermal coefficient of expansion of the thermometer grade platinum by more than .+-. 30%; the platinum layer has a thickness of from 0.1 to 10 .mu.m, and is applied at a temperature in the range of between about 1000.degree. C to 1400.degree. C during 60 minutes in an atmosphere containing oxygen, for example free air.

REFERENCES:
patent: 2802925 (1957-08-01), Von Seelen et al.
patent: 3412043 (1968-11-01), Gilliand
patent: 3781749 (1973-12-01), Sidney et al.
patent: 3845443 (1974-10-01), Fisher

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