Electrical shielding in stacked dies by using conductive die...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings

Reexamination Certificate

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Details

C257SE23052, C257SE23114, C257SE25013, C257S685000, C257S777000, C257S723000, C257S786000, C257S784000, C257S737000, C257SE21001

Reexamination Certificate

active

08076763

ABSTRACT:
In example embodiment, there is an integrated circuit (IC) device (5) assembled in a package (5) having a plurality of die including a first device (20) and at least one additional device (30). The IC comprises a substrate (10). A first device die (20), having bonding pads including ground connections, is die attached to the substrate (10). An additional device die (30), having bonding pads including ground connections is disposed on top of the first device die (20). The additional device die is die attached to the first device die. The ground connections of the first device die are connected to the ground connections of the additional device die in order to minimize the electrical interference between the device dies. An additional feature of the embodiment is, ground connections of the first device are connected to the ground connections of the additional device with a conductive adhesive (25).

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patent: WO 03/046098 (2003-06-01), None

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