Electrical property evaluation apparatus

Details Electrical property evaluation apparatus Electrical property evaluation apparatus

2007-03-06

2007-03-06

Aurora, Reena (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S210000

Reexamination Certificate

active

10809555

ABSTRACT:
An electrical property evaluation apparatus for measuring an electrical property of an object includes a magnetic field generating mechanism that generates a magnetic field in a target area on the object, and a magnetic sensor for measuring the magnetic field near the target area. A cantilever having a conducting probe is supported so that the probe can be brought into contact with the target area. A bending measurement mechanism measures an amount of bending of the cantilever when the probe is brought into contact with the object. A control section controls a moving mechanism to maintain the bending amount of the cantilever constant. A voltage source applies a voltage to the probe, and an electrical property measuring section measures a current or an electrical resistance between the probe and the object in contact with each other.

REFERENCES:
patent: 6294911 (2001-09-01), Shimazawa et al.
patent: 6657431 (2003-12-01), Xiao

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