Electrical probe with contact force protection

Details Electrical probe with contact force protection Electrical probe with contact force protection

1990-06-08

1991-04-30

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, 439482, G01R 3102

Patent

active

050121863

ABSTRACT:
An electrical probe tip is yieldably mounted on a probe mount so that, as the probe mount and a device under test are advanced toward each other, the contact force between the probe tip and the device under test first increases gradually and then decreases. This prevents excessive contact force if the probe mount and device under test are inadvertently advanced excessively toward each other, and thereby prevents damage to the probe tip.

REFERENCES:
patent: 3648169 (1972-03-01), Wiesler
patent: 3810017 (1974-05-01), Wiesler et al.
patent: 4123706 (1978-10-01), Roch
patent: 4251772 (1981-02-01), Worsham et al.
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4758785 (1988-07-01), Rath
patent: 4849689 (1989-07-01), Gleason et al.
patent: 4888550 (1989-12-01), Reid
Wagner et al, "Orbiting Probe", IBM Technical Bulletin, vol. 13, No. 7, Dec. 1970, pp. 2113-2114.
Graner et al, "Electrical Probe", IBM Technical Disclosure Bulletin, vol. 8, No. 12, May 1966, pp. 1722-1724.

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