Electrical probe contact

Geometrical instruments

Patent

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Details

339252P, H01R 410, H01R 1118

Patent

active

045964408

ABSTRACT:
An easy to manufacture, yet durable electrical probe contact is provided which is especially designed for connecting test equipment leads and patch cords to a variety of probe tips. The contact hereof includes a stamped and formed coupling portion that electrically and mechanically couples a wire lead to a screw machined or cold pressed probe tip. The manufacturing advantages inherent in stamped and formed contacts are thereby combined with the durability of screw machined and cold pressed tips. Moreover, the coupling portion is especially designed to receive a variety of tips, including the desirable banana plug type tip.

REFERENCES:
patent: 2802194 (1957-08-01), Kirk
patent: 2983892 (1961-05-01), Williams et al.
patent: 3277422 (1966-10-01), Shevlin
patent: 3718750 (1973-02-01), Sayers
patent: 3941449 (1976-03-01), Baumanis
patent: 4415223 (1983-11-01), Asick

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