Electrical probe and method for measuring gaps and other discont

Details Electrical probe and method for measuring gaps and other discont Electrical probe and method for measuring gaps and other discont

1992-12-22

1996-04-30

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324 66, G01R 2726

Patent

active

055128351

ABSTRACT:
An apparatus (30) locates and measures any seam or other discontinuity (18) within a metal enclosure (10) by determining the characteristic inductance of the discontinuity. A pair of probes or electrodes (40, 42) are connected via a balun (46) to a network analyzer (56). When the probes are placed on either side of the discontinuity, the network analyzer can measure the length of the discontinuity by equating the discontinuity to an inductor.

REFERENCES:
patent: 5041786 (1991-08-01), Takaishi et al.
patent: 5146163 (1992-09-01), Nawa

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