Thermal measuring and testing – Determination of inherent thermal property
Patent
1992-05-13
1993-06-08
Cuchlinski, Jr., William A.
Thermal measuring and testing
Determination of inherent thermal property
374 44, 374137, 324715, 324718, G01N 2520, G01N 2704, G01N 2718
Patent
active
052173046
ABSTRACT:
A method for modeling a conducting material sample or structure system, as an electrical network of resistances in which each resistance of the network is representative of a specific physical region of the system. The method encompasses measuring a resistance between two external leads and using this measurement in a series of equations describing the network to solve for the network resistances for a specified region and temperature. A calibration system is then developed using the calculated resistances at specified temperatures. This allows for the translation of the calculated resistances to a region temperature. The method can also be used to detect and quantify structural defects in the system.
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Albrecht John M.
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Moser William R.
Smith Bradley W.
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