Electrical interconnection for semiconductor integrated circuits

Stock material or miscellaneous articles – All metal or with adjacent metals – Composite; i.e. – plural – adjacent – spatially distinct metal...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

428650, 428651, 428660, 428663, 428665, 357 71R, H01L 21285, H01L 2130

Patent

active

046122575

ABSTRACT:
A structure for an electrical interconnection suitable for a semiconductor integrated circuit is made by a process utilizing selective tungsten deposition at low pressure to form an intermediate conductive layer without significantly ablating nearby insulating material.

REFERENCES:
patent: 3729406 (1973-04-01), Osborne et al.
patent: 3826626 (1974-07-01), Bhatt et al.
patent: 4267012 (1981-05-01), Pierce
patent: 4404235 (1983-09-01), Tarng
Shaw et al. Vapor Deposited Tungsten for Silicon Devices, Solid State Technology, pp. 53-57, Dec. 1, 1971.
Miller et al., Hot-Wall CVD Tungsten for VSLI, Solid State Technology, pp. 79-82, Dec. 1, 1980.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electrical interconnection for semiconductor integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrical interconnection for semiconductor integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical interconnection for semiconductor integrated circuits will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1995307

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.