Electrical fuse and associated methods

Active solid-state devices (e.g. – transistors – solid-state diode – Contacts or leads including fusible link means or noise...

Reexamination Certificate

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C257S529000, C257SE23149

Reexamination Certificate

active

07732898

ABSTRACT:
A fuse link of undoped material is connected between first and second doped material contact regions and a layer of conductive material is located above the first and second contact regions and the fuse link. According to other embodiments, a fuse link is connected between first and second contact regions. A layer of conductive material is above the first and second contact regions and the fuse link, and a heat sink is in proximity to the fuse link. In a method, a programming pulse is applied to a fuse link of undoped material connected between first and second doped material contact regions to generate electromigration drift of a conductive material above the first and second contact regions and the fuse link.

REFERENCES:
patent: 5883000 (1999-03-01), Pasch
patent: 6933591 (2005-08-01), Sidhu et al.
patent: 2002/0086462 (2002-07-01), Kothandaraman et al.
patent: 2002/0113291 (2002-08-01), Adkisson et al.
patent: 2003/0160297 (2003-08-01), Kothandaraman et al.
patent: 2003/0205777 (2003-11-01), Ito et al.
patent: 2003/0211661 (2003-11-01), Marr et al.
patent: 2004/0038458 (2004-02-01), Marr et al.
patent: 2004/0056325 (2004-03-01), Kothandaraman
patent: 2004/0099953 (2004-05-01), Liaw
patent: 2004/0222491 (2004-11-01), Ito et al.
patent: 2004/0224444 (2004-11-01), Hisaka
patent: 2005/0052892 (2005-03-01), Low et al.
patent: 2005/0087836 (2005-04-01), Wu
patent: 2005/0101114 (2005-05-01), Daubenspeck et al.
patent: 2005/0121741 (2005-06-01), Voldman
patent: 2005/0124097 (2005-06-01), Xiang
patent: 2005/0158919 (2005-07-01), Marr et al.
patent: 2005/0189613 (2005-09-01), Otsuka et al.
patent: 2005/0221539 (2005-10-01), Kim et al.
patent: 2005/0236688 (2005-10-01), Bang et al.
patent: 2005/0258505 (2005-11-01), Wu et al.
patent: 2005/0258506 (2005-11-01), Brintzinger et al.
patent: 2005/0258990 (2005-11-01), Babcock et al.
patent: 2005/0285222 (2005-12-01), Thei et al.
patent: 2006/0002187 (2006-01-01), Forbes
patent: 2006/0006494 (2006-01-01), Wu
patent: 2006/0022300 (2006-02-01), Wu et al.
patent: 2006/0030083 (2006-02-01), Wu
patent: 2006/0081959 (2006-04-01), Dondero et al.
patent: 2006/0087001 (2006-04-01), Kothandaraman et al.
patent: 2006/0108662 (2006-05-01), Kothandaraman et al.
patent: 2006/0157819 (2006-07-01), Wu
patent: 2006/0189042 (2006-08-01), Sakoh et al.
patent: 2006/0208274 (2006-09-01), Wu
patent: 2006/0223242 (2006-10-01), Daubenspeck et al.
patent: 2007/0252237 (2007-11-01), Ko et al.

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