Electrical connectors – Having retainer or passageway for fluent material – For urging contact toward or away from mating contact
Reexamination Certificate
2007-03-26
2008-11-25
Dinh, Phuong K (Department: 2839)
Electrical connectors
Having retainer or passageway for fluent material
For urging contact toward or away from mating contact
Reexamination Certificate
active
07455540
ABSTRACT:
An interconnect assembly can include a semiconductor device that is to be tested, and the semiconductor device can include compliant, elongate contact structures that provide an electrical interface to the semiconductor device. The interconnect assembly can also include a flexible wiring substrate, which can have electrical connections to a semiconductor tester. The flexible wiring substrate can also include electrically conductive contact features located on the substrate in a pattern that corresponds to the elongate contact structures of the semiconductor device to be tested. The flexible wiring substrate can also include wiring that interconnects the probes to the electrical connections to the semiconductor tester. The semiconductor device can be located such that some of the elongate contact structures of the semiconductor device are near some of the conductive contact features of the substrate.
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Burraston N. Kenneth
Dinh Phuong K
FormFactor Inc.
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